xref: /openbmc/u-boot/test/dm/serial.c (revision cd71b1d5)
1 // SPDX-License-Identifier: GPL-2.0
2 /*
3  * Copyright (c) 2018, STMicroelectronics
4  */
5 
6 #include <common.h>
7 #include <serial.h>
8 #include <dm.h>
9 #include <dm/test.h>
10 #include <test/ut.h>
11 
12 static int dm_test_serial(struct unit_test_state *uts)
13 {
14 	struct serial_device_info info_serial = {0};
15 	struct udevice *dev_serial;
16 	uint value_serial;
17 
18 	ut_assertok(uclass_get_device_by_name(UCLASS_SERIAL, "serial",
19 					      &dev_serial));
20 
21 	ut_assertok(serial_tstc());
22 	/*
23 	 * test with default config which is the only one supported by
24 	 * sandbox_serial driver
25 	 */
26 	ut_assertok(serial_setconfig(SERIAL_DEFAULT_CONFIG));
27 	ut_assertok(serial_getconfig(&value_serial));
28 	ut_assert(value_serial == SERIAL_DEFAULT_CONFIG);
29 	ut_assertok(serial_getinfo(&info_serial));
30 	ut_assert(info_serial.type == SERIAL_CHIP_UNKNOWN);
31 	ut_assert(info_serial.addr == SERIAL_DEFAULT_ADDRESS);
32 	/*
33 	 * test with a parameter which is NULL pointer
34 	 */
35 	ut_asserteq(-EINVAL, serial_getconfig(NULL));
36 	ut_asserteq(-EINVAL, serial_getinfo(NULL));
37 	/*
38 	 * test with a serial config which is not supported by
39 	 * sandbox_serial driver: test with wrong parity
40 	 */
41 	ut_asserteq(-ENOTSUPP,
42 		    serial_setconfig(SERIAL_CONFIG(SERIAL_PAR_ODD,
43 						   SERIAL_8_BITS,
44 						   SERIAL_ONE_STOP)));
45 	/*
46 	 * test with a serial config which is not supported by
47 	 * sandbox_serial driver: test with wrong bits number
48 	 */
49 	ut_asserteq(-ENOTSUPP,
50 		    serial_setconfig(SERIAL_CONFIG(SERIAL_PAR_NONE,
51 						   SERIAL_6_BITS,
52 						   SERIAL_ONE_STOP)));
53 
54 	/*
55 	 * test with a serial config which is not supported by
56 	 * sandbox_serial driver: test with wrong stop bits number
57 	 */
58 	ut_asserteq(-ENOTSUPP,
59 		    serial_setconfig(SERIAL_CONFIG(SERIAL_PAR_NONE,
60 						   SERIAL_8_BITS,
61 						   SERIAL_TWO_STOP)));
62 
63 	return 0;
64 }
65 
66 DM_TEST(dm_test_serial, DM_TESTF_SCAN_FDT);
67