xref: /openbmc/u-boot/test/dm/adc.c (revision d024236e)
1 /*
2  * Tests for the driver model ADC API
3  *
4  * Copyright (c) 2015 Samsung Electronics
5  * Przemyslaw Marczak <p.marczak@samsung.com>
6  *
7  * SPDX-License-Identifier:	GPL-2.0+
8  */
9 
10 #include <common.h>
11 #include <adc.h>
12 #include <dm.h>
13 #include <dm/root.h>
14 #include <dm/util.h>
15 #include <dm/test.h>
16 #include <errno.h>
17 #include <fdtdec.h>
18 #include <power/regulator.h>
19 #include <power/sandbox_pmic.h>
20 #include <sandbox-adc.h>
21 #include <test/ut.h>
22 
23 static int dm_test_adc_bind(struct unit_test_state *uts)
24 {
25 	struct udevice *dev;
26 
27 	ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
28 	ut_asserteq_str(SANDBOX_ADC_DEVNAME, dev->name);
29 
30 	return 0;
31 }
32 DM_TEST(dm_test_adc_bind, DM_TESTF_SCAN_FDT);
33 
34 static int dm_test_adc_wrong_channel_selection(struct unit_test_state *uts)
35 {
36 	struct udevice *dev;
37 
38 	ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
39 	ut_asserteq(-EINVAL, adc_start_channel(dev, SANDBOX_ADC_CHANNELS));
40 
41 	return 0;
42 }
43 DM_TEST(dm_test_adc_wrong_channel_selection, DM_TESTF_SCAN_FDT);
44 
45 static int dm_test_adc_supply(struct unit_test_state *uts)
46 {
47 	struct udevice *supply;
48 	struct udevice *dev;
49 	int uV;
50 
51 	ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
52 
53 	/* Test Vss value - predefined 0 uV */
54 	ut_assertok(adc_vss_value(dev, &uV));
55 	ut_asserteq(SANDBOX_ADC_VSS_VALUE, uV);
56 
57 	/* Test Vdd initial value - buck2 */
58 	ut_assertok(adc_vdd_value(dev, &uV));
59 	ut_asserteq(SANDBOX_BUCK2_INITIAL_EXPECTED_UV, uV);
60 
61 	/* Change Vdd value - buck2 manual preset */
62 	ut_assertok(regulator_get_by_devname(SANDBOX_BUCK2_DEVNAME, &supply));
63 	ut_assertok(regulator_set_value(supply, SANDBOX_BUCK2_SET_UV));
64 	ut_asserteq(SANDBOX_BUCK2_SET_UV, regulator_get_value(supply));
65 
66 	/* Update ADC platdata and get new Vdd value */
67 	ut_assertok(adc_vdd_value(dev, &uV));
68 	ut_asserteq(SANDBOX_BUCK2_SET_UV, uV);
69 
70 	/* Disable buck2 and test ADC supply enable function */
71 	ut_assertok(regulator_set_enable(supply, false));
72 	ut_asserteq(false, regulator_get_enable(supply));
73 	/* adc_start_channel() should enable the supply regulator */
74 	ut_assertok(adc_start_channel(dev, 0));
75 	ut_asserteq(true, regulator_get_enable(supply));
76 
77 	return 0;
78 }
79 DM_TEST(dm_test_adc_supply, DM_TESTF_SCAN_FDT);
80 
81 struct adc_channel adc_channel_test_data[] = {
82 	{ 0, SANDBOX_ADC_CHANNEL0_DATA },
83 	{ 1, SANDBOX_ADC_CHANNEL1_DATA },
84 	{ 2, SANDBOX_ADC_CHANNEL2_DATA },
85 	{ 3, SANDBOX_ADC_CHANNEL3_DATA },
86 };
87 
88 static int dm_test_adc_single_channel_conversion(struct unit_test_state *uts)
89 {
90 	struct adc_channel *tdata = adc_channel_test_data;
91 	unsigned int i, data;
92 	struct udevice *dev;
93 
94 	ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
95 	/* Test each ADC channel's value */
96 	for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
97 		ut_assertok(adc_start_channel(dev, tdata->id));
98 		ut_assertok(adc_channel_data(dev, tdata->id, &data));
99 		ut_asserteq(tdata->data, data);
100 	}
101 
102 	return 0;
103 }
104 DM_TEST(dm_test_adc_single_channel_conversion, DM_TESTF_SCAN_FDT);
105 
106 static int dm_test_adc_multi_channel_conversion(struct unit_test_state *uts)
107 {
108 	struct adc_channel channels[SANDBOX_ADC_CHANNELS];
109 	struct udevice *dev;
110 	struct adc_channel *tdata = adc_channel_test_data;
111 	unsigned int i, channel_mask;
112 
113 	channel_mask = ADC_CHANNEL(0) | ADC_CHANNEL(1) |
114 		       ADC_CHANNEL(2) | ADC_CHANNEL(3);
115 
116 	/* Start multi channel conversion */
117 	ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
118 	ut_assertok(adc_start_channels(dev, channel_mask));
119 	ut_assertok(adc_channels_data(dev, channel_mask, channels));
120 
121 	/* Compare the expected and returned conversion data. */
122 	for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++)
123 		ut_asserteq(tdata->data, channels[i].data);
124 
125 	return 0;
126 }
127 DM_TEST(dm_test_adc_multi_channel_conversion, DM_TESTF_SCAN_FDT);
128 
129 static int dm_test_adc_single_channel_shot(struct unit_test_state *uts)
130 {
131 	struct adc_channel *tdata = adc_channel_test_data;
132 	unsigned int i, data;
133 
134 	for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
135 		/* Start single channel conversion */
136 		ut_assertok(adc_channel_single_shot("adc", tdata->id, &data));
137 		/* Compare the expected and returned conversion data. */
138 		ut_asserteq(tdata->data, data);
139 	}
140 
141 	return 0;
142 }
143 DM_TEST(dm_test_adc_single_channel_shot, DM_TESTF_SCAN_FDT);
144 
145 static int dm_test_adc_multi_channel_shot(struct unit_test_state *uts)
146 {
147 	struct adc_channel channels[SANDBOX_ADC_CHANNELS];
148 	struct adc_channel *tdata = adc_channel_test_data;
149 	unsigned int i, channel_mask;
150 
151 	channel_mask = ADC_CHANNEL(0) | ADC_CHANNEL(1) |
152 		       ADC_CHANNEL(2) | ADC_CHANNEL(3);
153 
154 	/* Start single call and multi channel conversion */
155 	ut_assertok(adc_channels_single_shot("adc", channel_mask, channels));
156 
157 	/* Compare the expected and returned conversion data. */
158 	for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++)
159 		ut_asserteq(tdata->data, channels[i].data);
160 
161 	return 0;
162 }
163 DM_TEST(dm_test_adc_multi_channel_shot, DM_TESTF_SCAN_FDT);
164