1 /* 2 * linux/include/linux/mtd/nand.h 3 * 4 * Copyright (c) 2000 David Woodhouse <dwmw2@mvhi.com> 5 * Steven J. Hill <sjhill@realitydiluted.com> 6 * Thomas Gleixner <tglx@linutronix.de> 7 * 8 * $Id: nand.h,v 1.68 2004/11/12 10:40:37 gleixner Exp $ 9 * 10 * This program is free software; you can redistribute it and/or modify 11 * it under the terms of the GNU General Public License version 2 as 12 * published by the Free Software Foundation. 13 * 14 * Info: 15 * Contains standard defines and IDs for NAND flash devices 16 * 17 * Changelog: 18 * 01-31-2000 DMW Created 19 * 09-18-2000 SJH Moved structure out of the Disk-On-Chip drivers 20 * so it can be used by other NAND flash device 21 * drivers. I also changed the copyright since none 22 * of the original contents of this file are specific 23 * to DoC devices. David can whack me with a baseball 24 * bat later if I did something naughty. 25 * 10-11-2000 SJH Added private NAND flash structure for driver 26 * 10-24-2000 SJH Added prototype for 'nand_scan' function 27 * 10-29-2001 TG changed nand_chip structure to support 28 * hardwarespecific function for accessing control lines 29 * 02-21-2002 TG added support for different read/write adress and 30 * ready/busy line access function 31 * 02-26-2002 TG added chip_delay to nand_chip structure to optimize 32 * command delay times for different chips 33 * 04-28-2002 TG OOB config defines moved from nand.c to avoid duplicate 34 * defines in jffs2/wbuf.c 35 * 08-07-2002 TG forced bad block location to byte 5 of OOB, even if 36 * CONFIG_MTD_NAND_ECC_JFFS2 is not set 37 * 08-10-2002 TG extensions to nand_chip structure to support HW-ECC 38 * 39 * 08-29-2002 tglx nand_chip structure: data_poi for selecting 40 * internal / fs-driver buffer 41 * support for 6byte/512byte hardware ECC 42 * read_ecc, write_ecc extended for different oob-layout 43 * oob layout selections: NAND_NONE_OOB, NAND_JFFS2_OOB, 44 * NAND_YAFFS_OOB 45 * 11-25-2002 tglx Added Manufacturer code FUJITSU, NATIONAL 46 * Split manufacturer and device ID structures 47 * 48 * 02-08-2004 tglx added option field to nand structure for chip anomalities 49 * 05-25-2004 tglx added bad block table support, ST-MICRO manufacturer id 50 * update of nand_chip structure description 51 */ 52 #ifndef __LINUX_MTD_NAND_H 53 #define __LINUX_MTD_NAND_H 54 55 #include <linux/mtd/compat.h> 56 #include <linux/mtd/mtd.h> 57 58 struct mtd_info; 59 /* Scan and identify a NAND device */ 60 extern int nand_scan (struct mtd_info *mtd, int max_chips); 61 /* Free resources held by the NAND device */ 62 extern void nand_release (struct mtd_info *mtd); 63 64 /* Read raw data from the device without ECC */ 65 extern int nand_read_raw (struct mtd_info *mtd, uint8_t *buf, loff_t from, size_t len, size_t ooblen); 66 67 68 /* This constant declares the max. oobsize / page, which 69 * is supported now. If you add a chip with bigger oobsize/page 70 * adjust this accordingly. 71 */ 72 #define NAND_MAX_OOBSIZE 64 73 74 /* 75 * Constants for hardware specific CLE/ALE/NCE function 76 */ 77 /* Select the chip by setting nCE to low */ 78 #define NAND_CTL_SETNCE 1 79 /* Deselect the chip by setting nCE to high */ 80 #define NAND_CTL_CLRNCE 2 81 /* Select the command latch by setting CLE to high */ 82 #define NAND_CTL_SETCLE 3 83 /* Deselect the command latch by setting CLE to low */ 84 #define NAND_CTL_CLRCLE 4 85 /* Select the address latch by setting ALE to high */ 86 #define NAND_CTL_SETALE 5 87 /* Deselect the address latch by setting ALE to low */ 88 #define NAND_CTL_CLRALE 6 89 /* Set write protection by setting WP to high. Not used! */ 90 #define NAND_CTL_SETWP 7 91 /* Clear write protection by setting WP to low. Not used! */ 92 #define NAND_CTL_CLRWP 8 93 94 /* 95 * Standard NAND flash commands 96 */ 97 #define NAND_CMD_READ0 0 98 #define NAND_CMD_READ1 1 99 #define NAND_CMD_PAGEPROG 0x10 100 #define NAND_CMD_READOOB 0x50 101 #define NAND_CMD_ERASE1 0x60 102 #define NAND_CMD_STATUS 0x70 103 #define NAND_CMD_STATUS_MULTI 0x71 104 #define NAND_CMD_SEQIN 0x80 105 #define NAND_CMD_READID 0x90 106 #define NAND_CMD_ERASE2 0xd0 107 #define NAND_CMD_RESET 0xff 108 109 /* Extended commands for large page devices */ 110 #define NAND_CMD_READSTART 0x30 111 #define NAND_CMD_CACHEDPROG 0x15 112 113 /* Status bits */ 114 #define NAND_STATUS_FAIL 0x01 115 #define NAND_STATUS_FAIL_N1 0x02 116 #define NAND_STATUS_TRUE_READY 0x20 117 #define NAND_STATUS_READY 0x40 118 #define NAND_STATUS_WP 0x80 119 120 /* 121 * Constants for ECC_MODES 122 */ 123 124 /* No ECC. Usage is not recommended ! */ 125 #define NAND_ECC_NONE 0 126 /* Software ECC 3 byte ECC per 256 Byte data */ 127 #define NAND_ECC_SOFT 1 128 /* Hardware ECC 3 byte ECC per 256 Byte data */ 129 #define NAND_ECC_HW3_256 2 130 /* Hardware ECC 3 byte ECC per 512 Byte data */ 131 #define NAND_ECC_HW3_512 3 132 /* Hardware ECC 6 byte ECC per 512 Byte data */ 133 #define NAND_ECC_HW6_512 4 134 /* Hardware ECC 8 byte ECC per 512 Byte data */ 135 #define NAND_ECC_HW8_512 6 136 /* Hardware ECC 12 byte ECC per 2048 Byte data */ 137 #define NAND_ECC_HW12_2048 7 138 139 /* 140 * Constants for Hardware ECC 141 */ 142 /* Reset Hardware ECC for read */ 143 #define NAND_ECC_READ 0 144 /* Reset Hardware ECC for write */ 145 #define NAND_ECC_WRITE 1 146 /* Enable Hardware ECC before syndrom is read back from flash */ 147 #define NAND_ECC_READSYN 2 148 149 /* Option constants for bizarre disfunctionality and real 150 * features 151 */ 152 /* Chip can not auto increment pages */ 153 #define NAND_NO_AUTOINCR 0x00000001 154 /* Buswitdh is 16 bit */ 155 #define NAND_BUSWIDTH_16 0x00000002 156 /* Device supports partial programming without padding */ 157 #define NAND_NO_PADDING 0x00000004 158 /* Chip has cache program function */ 159 #define NAND_CACHEPRG 0x00000008 160 /* Chip has copy back function */ 161 #define NAND_COPYBACK 0x00000010 162 /* AND Chip which has 4 banks and a confusing page / block 163 * assignment. See Renesas datasheet for further information */ 164 #define NAND_IS_AND 0x00000020 165 /* Chip has a array of 4 pages which can be read without 166 * additional ready /busy waits */ 167 #define NAND_4PAGE_ARRAY 0x00000040 168 169 /* Options valid for Samsung large page devices */ 170 #define NAND_SAMSUNG_LP_OPTIONS \ 171 (NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK) 172 173 /* Macros to identify the above */ 174 #define NAND_CANAUTOINCR(chip) (!(chip->options & NAND_NO_AUTOINCR)) 175 #define NAND_MUST_PAD(chip) (!(chip->options & NAND_NO_PADDING)) 176 #define NAND_HAS_CACHEPROG(chip) ((chip->options & NAND_CACHEPRG)) 177 #define NAND_HAS_COPYBACK(chip) ((chip->options & NAND_COPYBACK)) 178 179 /* Mask to zero out the chip options, which come from the id table */ 180 #define NAND_CHIPOPTIONS_MSK (0x0000ffff & ~NAND_NO_AUTOINCR) 181 182 /* Non chip related options */ 183 /* Use a flash based bad block table. This option is passed to the 184 * default bad block table function. */ 185 #define NAND_USE_FLASH_BBT 0x00010000 186 /* The hw ecc generator provides a syndrome instead a ecc value on read 187 * This can only work if we have the ecc bytes directly behind the 188 * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */ 189 #define NAND_HWECC_SYNDROME 0x00020000 190 191 192 /* Options set by nand scan */ 193 /* Nand scan has allocated oob_buf */ 194 #define NAND_OOBBUF_ALLOC 0x40000000 195 /* Nand scan has allocated data_buf */ 196 #define NAND_DATABUF_ALLOC 0x80000000 197 198 199 /* 200 * nand_state_t - chip states 201 * Enumeration for NAND flash chip state 202 */ 203 typedef enum { 204 FL_READY, 205 FL_READING, 206 FL_WRITING, 207 FL_ERASING, 208 FL_SYNCING, 209 FL_CACHEDPRG, 210 } nand_state_t; 211 212 /* Keep gcc happy */ 213 struct nand_chip; 214 215 #if 0 216 /** 217 * struct nand_hw_control - Control structure for hardware controller (e.g ECC generator) shared among independend devices 218 * @lock: protection lock 219 * @active: the mtd device which holds the controller currently 220 */ 221 struct nand_hw_control { 222 spinlock_t lock; 223 struct nand_chip *active; 224 }; 225 #endif 226 227 /** 228 * struct nand_chip - NAND Private Flash Chip Data 229 * @IO_ADDR_R: [BOARDSPECIFIC] address to read the 8 I/O lines of the flash device 230 * @IO_ADDR_W: [BOARDSPECIFIC] address to write the 8 I/O lines of the flash device 231 * @read_byte: [REPLACEABLE] read one byte from the chip 232 * @write_byte: [REPLACEABLE] write one byte to the chip 233 * @read_word: [REPLACEABLE] read one word from the chip 234 * @write_word: [REPLACEABLE] write one word to the chip 235 * @write_buf: [REPLACEABLE] write data from the buffer to the chip 236 * @read_buf: [REPLACEABLE] read data from the chip into the buffer 237 * @verify_buf: [REPLACEABLE] verify buffer contents against the chip data 238 * @select_chip: [REPLACEABLE] select chip nr 239 * @block_bad: [REPLACEABLE] check, if the block is bad 240 * @block_markbad: [REPLACEABLE] mark the block bad 241 * @hwcontrol: [BOARDSPECIFIC] hardwarespecific function for accesing control-lines 242 * @dev_ready: [BOARDSPECIFIC] hardwarespecific function for accesing device ready/busy line 243 * If set to NULL no access to ready/busy is available and the ready/busy information 244 * is read from the chip status register 245 * @cmdfunc: [REPLACEABLE] hardwarespecific function for writing commands to the chip 246 * @waitfunc: [REPLACEABLE] hardwarespecific function for wait on ready 247 * @calculate_ecc: [REPLACEABLE] function for ecc calculation or readback from ecc hardware 248 * @correct_data: [REPLACEABLE] function for ecc correction, matching to ecc generator (sw/hw) 249 * @enable_hwecc: [BOARDSPECIFIC] function to enable (reset) hardware ecc generator. Must only 250 * be provided if a hardware ECC is available 251 * @erase_cmd: [INTERN] erase command write function, selectable due to AND support 252 * @scan_bbt: [REPLACEABLE] function to scan bad block table 253 * @eccmode: [BOARDSPECIFIC] mode of ecc, see defines 254 * @eccsize: [INTERN] databytes used per ecc-calculation 255 * @eccbytes: [INTERN] number of ecc bytes per ecc-calculation step 256 * @eccsteps: [INTERN] number of ecc calculation steps per page 257 * @chip_delay: [BOARDSPECIFIC] chip dependent delay for transfering data from array to read regs (tR) 258 * @chip_lock: [INTERN] spinlock used to protect access to this structure and the chip 259 * @wq: [INTERN] wait queue to sleep on if a NAND operation is in progress 260 * @state: [INTERN] the current state of the NAND device 261 * @page_shift: [INTERN] number of address bits in a page (column address bits) 262 * @phys_erase_shift: [INTERN] number of address bits in a physical eraseblock 263 * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry 264 * @chip_shift: [INTERN] number of address bits in one chip 265 * @data_buf: [INTERN] internal buffer for one page + oob 266 * @oob_buf: [INTERN] oob buffer for one eraseblock 267 * @oobdirty: [INTERN] indicates that oob_buf must be reinitialized 268 * @data_poi: [INTERN] pointer to a data buffer 269 * @options: [BOARDSPECIFIC] various chip options. They can partly be set to inform nand_scan about 270 * special functionality. See the defines for further explanation 271 * @badblockpos: [INTERN] position of the bad block marker in the oob area 272 * @numchips: [INTERN] number of physical chips 273 * @chipsize: [INTERN] the size of one chip for multichip arrays 274 * @pagemask: [INTERN] page number mask = number of (pages / chip) - 1 275 * @pagebuf: [INTERN] holds the pagenumber which is currently in data_buf 276 * @autooob: [REPLACEABLE] the default (auto)placement scheme 277 * @bbt: [INTERN] bad block table pointer 278 * @bbt_td: [REPLACEABLE] bad block table descriptor for flash lookup 279 * @bbt_md: [REPLACEABLE] bad block table mirror descriptor 280 * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for initial bad block scan 281 * @controller: [OPTIONAL] a pointer to a hardware controller structure which is shared among multiple independend devices 282 * @priv: [OPTIONAL] pointer to private chip date 283 */ 284 285 struct nand_chip { 286 void __iomem *IO_ADDR_R; 287 void __iomem *IO_ADDR_W; 288 289 u_char (*read_byte)(struct mtd_info *mtd); 290 void (*write_byte)(struct mtd_info *mtd, u_char byte); 291 u16 (*read_word)(struct mtd_info *mtd); 292 void (*write_word)(struct mtd_info *mtd, u16 word); 293 294 void (*write_buf)(struct mtd_info *mtd, const u_char *buf, int len); 295 void (*read_buf)(struct mtd_info *mtd, u_char *buf, int len); 296 int (*verify_buf)(struct mtd_info *mtd, const u_char *buf, int len); 297 void (*select_chip)(struct mtd_info *mtd, int chip); 298 int (*block_bad)(struct mtd_info *mtd, loff_t ofs, int getchip); 299 int (*block_markbad)(struct mtd_info *mtd, loff_t ofs); 300 void (*hwcontrol)(struct mtd_info *mtd, int cmd); 301 int (*dev_ready)(struct mtd_info *mtd); 302 void (*cmdfunc)(struct mtd_info *mtd, unsigned command, int column, int page_addr); 303 int (*waitfunc)(struct mtd_info *mtd, struct nand_chip *this, int state); 304 int (*calculate_ecc)(struct mtd_info *mtd, const u_char *dat, u_char *ecc_code); 305 int (*correct_data)(struct mtd_info *mtd, u_char *dat, u_char *read_ecc, u_char *calc_ecc); 306 void (*enable_hwecc)(struct mtd_info *mtd, int mode); 307 void (*erase_cmd)(struct mtd_info *mtd, int page); 308 int (*scan_bbt)(struct mtd_info *mtd); 309 int eccmode; 310 int eccsize; 311 int eccbytes; 312 int eccsteps; 313 int chip_delay; 314 #if 0 315 spinlock_t chip_lock; 316 wait_queue_head_t wq; 317 nand_state_t state; 318 #endif 319 int page_shift; 320 int phys_erase_shift; 321 int bbt_erase_shift; 322 int chip_shift; 323 u_char *data_buf; 324 u_char *oob_buf; 325 int oobdirty; 326 u_char *data_poi; 327 unsigned int options; 328 int badblockpos; 329 int numchips; 330 unsigned long chipsize; 331 int pagemask; 332 int pagebuf; 333 struct nand_oobinfo *autooob; 334 uint8_t *bbt; 335 struct nand_bbt_descr *bbt_td; 336 struct nand_bbt_descr *bbt_md; 337 struct nand_bbt_descr *badblock_pattern; 338 struct nand_hw_control *controller; 339 void *priv; 340 }; 341 342 /* 343 * NAND Flash Manufacturer ID Codes 344 */ 345 #define NAND_MFR_TOSHIBA 0x98 346 #define NAND_MFR_SAMSUNG 0xec 347 #define NAND_MFR_FUJITSU 0x04 348 #define NAND_MFR_NATIONAL 0x8f 349 #define NAND_MFR_RENESAS 0x07 350 #define NAND_MFR_STMICRO 0x20 351 #define NAND_MFR_MICRON 0x2c 352 353 /** 354 * struct nand_flash_dev - NAND Flash Device ID Structure 355 * 356 * @name: Identify the device type 357 * @id: device ID code 358 * @pagesize: Pagesize in bytes. Either 256 or 512 or 0 359 * If the pagesize is 0, then the real pagesize 360 * and the eraseize are determined from the 361 * extended id bytes in the chip 362 * @erasesize: Size of an erase block in the flash device. 363 * @chipsize: Total chipsize in Mega Bytes 364 * @options: Bitfield to store chip relevant options 365 */ 366 struct nand_flash_dev { 367 char *name; 368 int id; 369 unsigned long pagesize; 370 unsigned long chipsize; 371 unsigned long erasesize; 372 unsigned long options; 373 }; 374 375 /** 376 * struct nand_manufacturers - NAND Flash Manufacturer ID Structure 377 * @name: Manufacturer name 378 * @id: manufacturer ID code of device. 379 */ 380 struct nand_manufacturers { 381 int id; 382 char * name; 383 }; 384 385 extern struct nand_flash_dev nand_flash_ids[]; 386 extern struct nand_manufacturers nand_manuf_ids[]; 387 388 #ifndef NAND_MAX_CHIPS 389 #define NAND_MAX_CHIPS 8 390 #endif 391 392 /** 393 * struct nand_bbt_descr - bad block table descriptor 394 * @options: options for this descriptor 395 * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE 396 * when bbt is searched, then we store the found bbts pages here. 397 * Its an array and supports up to 8 chips now 398 * @offs: offset of the pattern in the oob area of the page 399 * @veroffs: offset of the bbt version counter in the oob are of the page 400 * @version: version read from the bbt page during scan 401 * @len: length of the pattern, if 0 no pattern check is performed 402 * @maxblocks: maximum number of blocks to search for a bbt. This number of 403 * blocks is reserved at the end of the device where the tables are 404 * written. 405 * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than 406 * bad) block in the stored bbt 407 * @pattern: pattern to identify bad block table or factory marked good / 408 * bad blocks, can be NULL, if len = 0 409 * 410 * Descriptor for the bad block table marker and the descriptor for the 411 * pattern which identifies good and bad blocks. The assumption is made 412 * that the pattern and the version count are always located in the oob area 413 * of the first block. 414 */ 415 struct nand_bbt_descr { 416 int options; 417 int pages[NAND_MAX_CHIPS]; 418 int offs; 419 int veroffs; 420 uint8_t version[NAND_MAX_CHIPS]; 421 int len; 422 int maxblocks; 423 int reserved_block_code; 424 uint8_t *pattern; 425 }; 426 427 /* Options for the bad block table descriptors */ 428 429 /* The number of bits used per block in the bbt on the device */ 430 #define NAND_BBT_NRBITS_MSK 0x0000000F 431 #define NAND_BBT_1BIT 0x00000001 432 #define NAND_BBT_2BIT 0x00000002 433 #define NAND_BBT_4BIT 0x00000004 434 #define NAND_BBT_8BIT 0x00000008 435 /* The bad block table is in the last good block of the device */ 436 #define NAND_BBT_LASTBLOCK 0x00000010 437 /* The bbt is at the given page, else we must scan for the bbt */ 438 #define NAND_BBT_ABSPAGE 0x00000020 439 /* The bbt is at the given page, else we must scan for the bbt */ 440 #define NAND_BBT_SEARCH 0x00000040 441 /* bbt is stored per chip on multichip devices */ 442 #define NAND_BBT_PERCHIP 0x00000080 443 /* bbt has a version counter at offset veroffs */ 444 #define NAND_BBT_VERSION 0x00000100 445 /* Create a bbt if none axists */ 446 #define NAND_BBT_CREATE 0x00000200 447 /* Search good / bad pattern through all pages of a block */ 448 #define NAND_BBT_SCANALLPAGES 0x00000400 449 /* Scan block empty during good / bad block scan */ 450 #define NAND_BBT_SCANEMPTY 0x00000800 451 /* Write bbt if neccecary */ 452 #define NAND_BBT_WRITE 0x00001000 453 /* Read and write back block contents when writing bbt */ 454 #define NAND_BBT_SAVECONTENT 0x00002000 455 /* Search good / bad pattern on the first and the second page */ 456 #define NAND_BBT_SCAN2NDPAGE 0x00004000 457 458 /* The maximum number of blocks to scan for a bbt */ 459 #define NAND_BBT_SCAN_MAXBLOCKS 4 460 461 extern int nand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd); 462 extern int nand_update_bbt (struct mtd_info *mtd, loff_t offs); 463 extern int nand_default_bbt (struct mtd_info *mtd); 464 extern int nand_isbad_bbt (struct mtd_info *mtd, loff_t offs, int allowbbt); 465 extern int nand_erase_nand (struct mtd_info *mtd, struct erase_info *instr, int allowbbt); 466 467 /* 468 * Constants for oob configuration 469 */ 470 #define NAND_SMALL_BADBLOCK_POS 5 471 #define NAND_LARGE_BADBLOCK_POS 0 472 473 #endif /* __LINUX_MTD_NAND_H */ 474