xref: /openbmc/linux/include/linux/mfd/abx500.h (revision 39b6f3aa)
1 /*
2  * Copyright (C) 2007-2009 ST-Ericsson AB
3  * License terms: GNU General Public License (GPL) version 2
4  *
5  * ABX500 core access functions.
6  * The abx500 interface is used for the Analog Baseband chips.
7  *
8  * Author: Mattias Wallin <mattias.wallin@stericsson.com>
9  * Author: Mattias Nilsson <mattias.i.nilsson@stericsson.com>
10  * Author: Bengt Jonsson <bengt.g.jonsson@stericsson.com>
11  * Author: Rickard Andersson <rickard.andersson@stericsson.com>
12  */
13 
14 #include <linux/regulator/machine.h>
15 
16 struct device;
17 
18 #ifndef MFD_ABX500_H
19 #define MFD_ABX500_H
20 
21 /**
22  * struct abx500_init_setting
23  * Initial value of the registers for driver to use during setup.
24  */
25 struct abx500_init_settings {
26 	u8 bank;
27 	u8 reg;
28 	u8 setting;
29 };
30 
31 /* Battery driver related data */
32 /*
33  * ADC for the battery thermistor.
34  * When using the ABx500_ADC_THERM_BATCTRL the battery ID resistor is combined
35  * with a NTC resistor to both identify the battery and to measure its
36  * temperature. Different phone manufactures uses different techniques to both
37  * identify the battery and to read its temperature.
38  */
39 enum abx500_adc_therm {
40 	ABx500_ADC_THERM_BATCTRL,
41 	ABx500_ADC_THERM_BATTEMP,
42 };
43 
44 /**
45  * struct abx500_res_to_temp - defines one point in a temp to res curve. To
46  * be used in battery packs that combines the identification resistor with a
47  * NTC resistor.
48  * @temp:			battery pack temperature in Celcius
49  * @resist:			NTC resistor net total resistance
50  */
51 struct abx500_res_to_temp {
52 	int temp;
53 	int resist;
54 };
55 
56 /**
57  * struct abx500_v_to_cap - Table for translating voltage to capacity
58  * @voltage:		Voltage in mV
59  * @capacity:		Capacity in percent
60  */
61 struct abx500_v_to_cap {
62 	int voltage;
63 	int capacity;
64 };
65 
66 /* Forward declaration */
67 struct abx500_fg;
68 
69 /**
70  * struct abx500_fg_parameters - Fuel gauge algorithm parameters, in seconds
71  * if not specified
72  * @recovery_sleep_timer:	Time between measurements while recovering
73  * @recovery_total_time:	Total recovery time
74  * @init_timer:			Measurement interval during startup
75  * @init_discard_time:		Time we discard voltage measurement at startup
76  * @init_total_time:		Total init time during startup
77  * @high_curr_time:		Time current has to be high to go to recovery
78  * @accu_charging:		FG accumulation time while charging
79  * @accu_high_curr:		FG accumulation time in high current mode
80  * @high_curr_threshold:	High current threshold, in mA
81  * @lowbat_threshold:		Low battery threshold, in mV
82  * @overbat_threshold:		Over battery threshold, in mV
83  * @battok_falling_th_sel0	Threshold in mV for battOk signal sel0
84  *				Resolution in 50 mV step.
85  * @battok_raising_th_sel1	Threshold in mV for battOk signal sel1
86  *				Resolution in 50 mV step.
87  * @user_cap_limit		Capacity reported from user must be within this
88  *				limit to be considered as sane, in percentage
89  *				points.
90  * @maint_thres			This is the threshold where we stop reporting
91  *				battery full while in maintenance, in per cent
92  * @pcut_enable:			Enable power cut feature in ab8505
93  * @pcut_max_time:		Max time threshold
94  * @pcut_flag_time:		Flagtime threshold
95  * @pcut_max_restart:		Max number of restarts
96  * @pcut_debounce_time:		Sets battery debounce time
97  */
98 struct abx500_fg_parameters {
99 	int recovery_sleep_timer;
100 	int recovery_total_time;
101 	int init_timer;
102 	int init_discard_time;
103 	int init_total_time;
104 	int high_curr_time;
105 	int accu_charging;
106 	int accu_high_curr;
107 	int high_curr_threshold;
108 	int lowbat_threshold;
109 	int overbat_threshold;
110 	int battok_falling_th_sel0;
111 	int battok_raising_th_sel1;
112 	int user_cap_limit;
113 	int maint_thres;
114 	bool pcut_enable;
115 	u8 pcut_max_time;
116 	u8 pcut_flag_time;
117 	u8 pcut_max_restart;
118 	u8 pcut_debounce_time;
119 };
120 
121 /**
122  * struct abx500_charger_maximization - struct used by the board config.
123  * @use_maxi:		Enable maximization for this battery type
124  * @maxi_chg_curr:	Maximum charger current allowed
125  * @maxi_wait_cycles:	cycles to wait before setting charger current
126  * @charger_curr_step	delta between two charger current settings (mA)
127  */
128 struct abx500_maxim_parameters {
129 	bool ena_maxi;
130 	int chg_curr;
131 	int wait_cycles;
132 	int charger_curr_step;
133 };
134 
135 /**
136  * struct abx500_battery_type - different batteries supported
137  * @name:			battery technology
138  * @resis_high:			battery upper resistance limit
139  * @resis_low:			battery lower resistance limit
140  * @charge_full_design:		Maximum battery capacity in mAh
141  * @nominal_voltage:		Nominal voltage of the battery in mV
142  * @termination_vol:		max voltage upto which battery can be charged
143  * @termination_curr		battery charging termination current in mA
144  * @recharge_cap		battery capacity limit that will trigger a new
145  *				full charging cycle in the case where maintenan-
146  *				-ce charging has been disabled
147  * @normal_cur_lvl:		charger current in normal state in mA
148  * @normal_vol_lvl:		charger voltage in normal state in mV
149  * @maint_a_cur_lvl:		charger current in maintenance A state in mA
150  * @maint_a_vol_lvl:		charger voltage in maintenance A state in mV
151  * @maint_a_chg_timer_h:	charge time in maintenance A state
152  * @maint_b_cur_lvl:		charger current in maintenance B state in mA
153  * @maint_b_vol_lvl:		charger voltage in maintenance B state in mV
154  * @maint_b_chg_timer_h:	charge time in maintenance B state
155  * @low_high_cur_lvl:		charger current in temp low/high state in mA
156  * @low_high_vol_lvl:		charger voltage in temp low/high state in mV'
157  * @battery_resistance:		battery inner resistance in mOhm.
158  * @n_r_t_tbl_elements:		number of elements in r_to_t_tbl
159  * @r_to_t_tbl:			table containing resistance to temp points
160  * @n_v_cap_tbl_elements:	number of elements in v_to_cap_tbl
161  * @v_to_cap_tbl:		Voltage to capacity (in %) table
162  * @n_batres_tbl_elements	number of elements in the batres_tbl
163  * @batres_tbl			battery internal resistance vs temperature table
164  */
165 struct abx500_battery_type {
166 	int name;
167 	int resis_high;
168 	int resis_low;
169 	int charge_full_design;
170 	int nominal_voltage;
171 	int termination_vol;
172 	int termination_curr;
173 	int recharge_cap;
174 	int normal_cur_lvl;
175 	int normal_vol_lvl;
176 	int maint_a_cur_lvl;
177 	int maint_a_vol_lvl;
178 	int maint_a_chg_timer_h;
179 	int maint_b_cur_lvl;
180 	int maint_b_vol_lvl;
181 	int maint_b_chg_timer_h;
182 	int low_high_cur_lvl;
183 	int low_high_vol_lvl;
184 	int battery_resistance;
185 	int n_temp_tbl_elements;
186 	const struct abx500_res_to_temp *r_to_t_tbl;
187 	int n_v_cap_tbl_elements;
188 	const struct abx500_v_to_cap *v_to_cap_tbl;
189 	int n_batres_tbl_elements;
190 	const struct batres_vs_temp *batres_tbl;
191 };
192 
193 /**
194  * struct abx500_bm_capacity_levels - abx500 capacity level data
195  * @critical:		critical capacity level in percent
196  * @low:		low capacity level in percent
197  * @normal:		normal capacity level in percent
198  * @high:		high capacity level in percent
199  * @full:		full capacity level in percent
200  */
201 struct abx500_bm_capacity_levels {
202 	int critical;
203 	int low;
204 	int normal;
205 	int high;
206 	int full;
207 };
208 
209 /**
210  * struct abx500_bm_charger_parameters - Charger specific parameters
211  * @usb_volt_max:	maximum allowed USB charger voltage in mV
212  * @usb_curr_max:	maximum allowed USB charger current in mA
213  * @ac_volt_max:	maximum allowed AC charger voltage in mV
214  * @ac_curr_max:	maximum allowed AC charger current in mA
215  */
216 struct abx500_bm_charger_parameters {
217 	int usb_volt_max;
218 	int usb_curr_max;
219 	int ac_volt_max;
220 	int ac_curr_max;
221 };
222 
223 /**
224  * struct abx500_bm_data - abx500 battery management data
225  * @temp_under		under this temp, charging is stopped
226  * @temp_low		between this temp and temp_under charging is reduced
227  * @temp_high		between this temp and temp_over charging is reduced
228  * @temp_over		over this temp, charging is stopped
229  * @temp_now		present battery temperature
230  * @temp_interval_chg	temperature measurement interval in s when charging
231  * @temp_interval_nochg	temperature measurement interval in s when not charging
232  * @main_safety_tmr_h	safety timer for main charger
233  * @usb_safety_tmr_h	safety timer for usb charger
234  * @bkup_bat_v		voltage which we charge the backup battery with
235  * @bkup_bat_i		current which we charge the backup battery with
236  * @no_maintenance	indicates that maintenance charging is disabled
237  * @capacity_scaling    indicates whether capacity scaling is to be used
238  * @abx500_adc_therm	placement of thermistor, batctrl or battemp adc
239  * @chg_unknown_bat	flag to enable charging of unknown batteries
240  * @enable_overshoot	flag to enable VBAT overshoot control
241  * @auto_trig		flag to enable auto adc trigger
242  * @fg_res		resistance of FG resistor in 0.1mOhm
243  * @n_btypes		number of elements in array bat_type
244  * @batt_id		index of the identified battery in array bat_type
245  * @interval_charging	charge alg cycle period time when charging (sec)
246  * @interval_not_charging charge alg cycle period time when not charging (sec)
247  * @temp_hysteresis	temperature hysteresis
248  * @gnd_lift_resistance	Battery ground to phone ground resistance (mOhm)
249  * @n_chg_out_curr		number of elements in array chg_output_curr
250  * @n_chg_in_curr		number of elements in array chg_input_curr
251  * @chg_output_curr	charger output current level map
252  * @chg_input_curr		charger input current level map
253  * @maxi		maximization parameters
254  * @cap_levels		capacity in percent for the different capacity levels
255  * @bat_type		table of supported battery types
256  * @chg_params		charger parameters
257  * @fg_params		fuel gauge parameters
258  */
259 struct abx500_bm_data {
260 	int temp_under;
261 	int temp_low;
262 	int temp_high;
263 	int temp_over;
264 	int temp_now;
265 	int temp_interval_chg;
266 	int temp_interval_nochg;
267 	int main_safety_tmr_h;
268 	int usb_safety_tmr_h;
269 	int bkup_bat_v;
270 	int bkup_bat_i;
271 	bool autopower_cfg;
272 	bool ac_enabled;
273 	bool usb_enabled;
274 	bool usb_power_path;
275 	bool no_maintenance;
276 	bool capacity_scaling;
277 	bool chg_unknown_bat;
278 	bool enable_overshoot;
279 	bool auto_trig;
280 	enum abx500_adc_therm adc_therm;
281 	int fg_res;
282 	int n_btypes;
283 	int batt_id;
284 	int interval_charging;
285 	int interval_not_charging;
286 	int temp_hysteresis;
287 	int gnd_lift_resistance;
288 	int n_chg_out_curr;
289 	int n_chg_in_curr;
290 	int *chg_output_curr;
291 	int *chg_input_curr;
292 	const struct abx500_maxim_parameters *maxi;
293 	const struct abx500_bm_capacity_levels *cap_levels;
294 	struct abx500_battery_type *bat_type;
295 	const struct abx500_bm_charger_parameters *chg_params;
296 	const struct abx500_fg_parameters *fg_params;
297 };
298 
299 enum {
300 	NTC_EXTERNAL = 0,
301 	NTC_INTERNAL,
302 };
303 
304 int ab8500_bm_of_probe(struct device *dev,
305 		       struct device_node *np,
306 		       struct abx500_bm_data *bm);
307 
308 int abx500_set_register_interruptible(struct device *dev, u8 bank, u8 reg,
309 	u8 value);
310 int abx500_get_register_interruptible(struct device *dev, u8 bank, u8 reg,
311 	u8 *value);
312 int abx500_get_register_page_interruptible(struct device *dev, u8 bank,
313 	u8 first_reg, u8 *regvals, u8 numregs);
314 int abx500_set_register_page_interruptible(struct device *dev, u8 bank,
315 	u8 first_reg, u8 *regvals, u8 numregs);
316 /**
317  * abx500_mask_and_set_register_inerruptible() - Modifies selected bits of a
318  *	target register
319  *
320  * @dev: The AB sub device.
321  * @bank: The i2c bank number.
322  * @bitmask: The bit mask to use.
323  * @bitvalues: The new bit values.
324  *
325  * Updates the value of an AB register:
326  * value -> ((value & ~bitmask) | (bitvalues & bitmask))
327  */
328 int abx500_mask_and_set_register_interruptible(struct device *dev, u8 bank,
329 	u8 reg, u8 bitmask, u8 bitvalues);
330 int abx500_get_chip_id(struct device *dev);
331 int abx500_event_registers_startup_state_get(struct device *dev, u8 *event);
332 int abx500_startup_irq_enabled(struct device *dev, unsigned int irq);
333 void abx500_dump_all_banks(void);
334 
335 struct abx500_ops {
336 	int (*get_chip_id) (struct device *);
337 	int (*get_register) (struct device *, u8, u8, u8 *);
338 	int (*set_register) (struct device *, u8, u8, u8);
339 	int (*get_register_page) (struct device *, u8, u8, u8 *, u8);
340 	int (*set_register_page) (struct device *, u8, u8, u8 *, u8);
341 	int (*mask_and_set_register) (struct device *, u8, u8, u8, u8);
342 	int (*event_registers_startup_state_get) (struct device *, u8 *);
343 	int (*startup_irq_enabled) (struct device *, unsigned int);
344 	void (*dump_all_banks) (struct device *);
345 };
346 
347 int abx500_register_ops(struct device *core_dev, struct abx500_ops *ops);
348 void abx500_remove_ops(struct device *dev);
349 #endif
350