91         // Create vector of Device objects  in TEST_F()
96         // Create Chassis  in TEST_F()
121     // Create vector of Device objects  in TEST_F()
127     // Create Chassis  in TEST_F()
149     // Create PresenceDetection  in TEST_F()
155     // Create Device that contains PresenceDetection  in TEST_F()
163     // Create Chassis that contains Device  in TEST_F()
182     // Create SensorMonitoring.  Will fail with a DBus exception.  in TEST_F()
191     // Create Rail  in TEST_F()
196     // Create Device that contains Rail  in TEST_F()
210     // Create Chassis that contains Device  in TEST_F()
215     // Create lambda that sets MockServices expectations.  The lambda allows  in TEST_F()
237         // Create mock services.  Set expectations via lambda.  in TEST_F()
252         // Create mock services.  Set expectations via lambda.  in TEST_F()
267         // Create mock services.  Expect logDebug() to be called.  in TEST_F()
272         // Create Chassis  in TEST_F()
283         // Create mock services.  Expect logDebug() to be called.  in TEST_F()
288         // Create Device vdd0_reg  in TEST_F()
290             // Create mock I2CInterface: isOpen() and close() should be called  in TEST_F()
295             // Create Device  in TEST_F()
304         // Create Device vdd1_reg  in TEST_F()
306             // Create mock I2CInterface: isOpen() and close() should be called  in TEST_F()
311             // Create Device  in TEST_F()
320         // Create Chassis  in TEST_F()
332         // Create mock services.  Expect logInfo() to be called.  in TEST_F()
339         // Create Chassis  in TEST_F()
350         // Create mock services.  Expect logInfo() and logDebug() to be called.  in TEST_F()
360         // Create Device vdd0_reg  in TEST_F()
362             // Create Configuration  in TEST_F()
367             // Create Device  in TEST_F()
379         // Create Device vdd1_reg  in TEST_F()
381             // Create Configuration  in TEST_F()
386             // Create Device  in TEST_F()
398         // Create Chassis  in TEST_F()
410         // Create mock services.  No errors should be logged.  in TEST_F()
417         // Create Chassis  in TEST_F()
429         // Create mock services with the following expectations:  in TEST_F()
457         // Create Device reg0  in TEST_F()
459             // Create PhaseFaultDetection  in TEST_F()
467             // Create Device  in TEST_F()
480         // Create Device reg1  in TEST_F()
482             // Create PhaseFaultDetection  in TEST_F()
490             // Create Device  in TEST_F()
503         // Create Chassis  in TEST_F()
524         // Create vector of Device objects  in TEST_F()
529         // Create Chassis  in TEST_F()
553         // Create mock services.  No Sensors methods should be called.  in TEST_F()
560         // Create Chassis  in TEST_F()
569         // Create mock services.  Set Sensors service expectations.  in TEST_F()
587         // Create Device vdd0_reg  in TEST_F()
589             // Create SensorMonitoring for Rail  in TEST_F()
597             // Create Rail  in TEST_F()
602             // Create Device  in TEST_F()
619         // Create Device vdd1_reg  in TEST_F()
621             // Create SensorMonitoring for Rail  in TEST_F()
629             // Create Rail  in TEST_F()
634             // Create Device  in TEST_F()
651         // Create Chassis that contains Devices  in TEST_F()