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| H A D | ov5640.c | a0c29afb Fri Jan 18 02:52:02 CST 2019 Chen-Yu Tsai <wens@csie.org> media: ov5640: Add register definition for test pattern register
The OV5640 can generate many types of test patterns, some with
additional modifiers, such as a rolling bar, or gamma gradients.
Add the bit definitions for all bits in the test pattern register,
and use them to compose the values to be written to the register.
Signed-off-by: Chen-Yu Tsai <wens@csie.org>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab+samsung@kernel.org>
a0c29afb Fri Jan 18 02:52:02 CST 2019 Chen-Yu Tsai <wens@csie.org> media: ov5640: Add register definition for test pattern register
The OV5640 can generate many types of test patterns, some with
additional modifiers, such as a rolling bar, or gamma gradients.
Add the bit definitions for all bits in the test pattern register,
and use them to compose the values to be written to the register.
Signed-off-by: Chen-Yu Tsai <wens@csie.org>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab+samsung@kernel.org>
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